Designing Fault-Tolerant Test Infrastructure for Large-Scale GPU Manufacturing. International journal of signal processing, embedded systems and VLSI design, [S. l.], v. 5, n. 01, p. 35–61, 2025. DOI: 10.55640/ijvsli-05-01-04. Disponível em: https://www.academicpublishers.org/journals/index.php/ijvsli/article/view/4608.. Acesso em: 12 nov. 2025.