REVEALING THE SURFACE SECRETS: CHARACTERIZING MO/SI MULTILAYERS WITH TOTAL ELECTRON YIELD AND X-RAY REFLECTIVITY TECHNIQUES. International journal of lasers, photonics and optics, [S. l.], v. 4, n. 01, p. 01–05, 2024. Disponível em: https://www.academicpublishers.org/journals/index.php/ijlpo/article/view/208.. Acesso em: 21 sep. 2025.