“REVEALING THE SURFACE SECRETS: CHARACTERIZING MO SI MULTILAYERS WITH TOTAL ELECTRON YIELD AND X-RAY REFLECTIVITY TECHNIQUES”. International journal of lasers, photonics and optics 4, no. 01 (January 1, 2024): 01–05. Accessed September 21, 2025. https://www.academicpublishers.org/journals/index.php/ijlpo/article/view/208.