REVEALING THE SURFACE SECRETS: CHARACTERIZING MO/SI MULTILAYERS WITH TOTAL ELECTRON YIELD AND X-RAY REFLECTIVITY TECHNIQUES. ijlpo [Internet]. 2024 Jan. 1 [cited 2025 Sep. 21];4(01):01-5. Available from: https://www.academicpublishers.org/journals/index.php/ijlpo/article/view/208