A Deep Learning Approach to Electromagnetic Compatibility Test Signal Prediction Using LSTM Networks. International journal of signal processing, embedded systems and VLSI design, [S. l.], v. 5, n. 01, p. 05–09, 2025. Disponível em: https://www.academicpublishers.org/journals/index.php/ijvsli/article/view/4198.. Acesso em: 12 nov. 2025.