This study delves into the electrical properties of silver thin layers, employing the Four-Point Probe method to unveil their conductivity characteristics. Silver, renowned for its exceptional electrical conductivity, is examined at the nanoscale to understand its behavior in thin film form. The investigation reveals not only the electrical resistivity and conductivity of these layers but also explores the intriguing thickness-dependent conductivity phenomenon. The results affirm silver's remarkable conductivity and offer insights into its potential applications in nanoelectronics. This work contributes to the broader understanding of nanoscale materials and their role in shaping the future of electronic devices.

Silver thin layers, Electrical properties, Four-Point Probe method

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